ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .3. SI(111)-(7X7)

被引:78
作者
TROMP, RM [1 ]
VANLOENEN, EJ [1 ]
机构
[1] FOM,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
关键词
D O I
10.1016/0039-6028(85)90009-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:441 / 479
页数:39
相关论文
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