SIMULATION OF THE RECORDING PROCESS WITH A VSM ON CO-CR AND CO-NI-O LAYERS DEPOSITED AT OBLIQUE-INCIDENCE

The recording process on Co-Cr and Co-Ni-O layers deposited at oblique incidence is simulated with a vibrating sample magnetometer. The Co-Cr layers are deposited on Si substrates and have an easy magnetisation direction tilted 15° from the normal to the layer, which is caused by the presence of columnar shape anisotropy. The simulation experiments show that such a layer is more sensitive to one side of the perpendicular component of the write field of a ring head. The Co-Ni-O sample has an easy direction of magnetisation tilted about 20° out of the plane. The simulation experiments show that the steepness of the transition is different for the two directions of head movement. © 1990 IEEE