CHARGE-SHEET MODEL-FITTING TO EXTRACT RADIATION-INDUCED OXIDE AND INTERFACE CHARGE

被引：22

作者：

GALLOWAY, KF ^{[1
]}

WILSON, CL ^{[1
]}

WITTE, LC ^{[1
]}

机构：

[1] UNIV MARYLAND,DEPT ELECT ENGN,COLLEGE PK,MD 20741

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334142

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4461 / 4465

页数：5

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[9] PHYSICAL-MECHANISMS CONTRIBUTING TO DEVICE REBOUND [J].

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