GROWTH-KINETICS AND BEHAVIOR OF DUST PARTICLES IN SILANE PLASMAS

被引:38
作者
WATANABE, Y
SHIRATANI, M
机构
[1] Department of Electrical Engineering, Kyushu University, Hakozaki, Fukuoka
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 6B期
关键词
DUST PARTICLE; SILANE PLASMA; RF DISCHARGE; LASER LIGHT SCATTERING METHOD; PLASMA PROCESSING; PLASMA CHEMICAL VAPOR DEPOSITION; PCVD; CVD;
D O I
10.1143/JJAP.32.3074
中图分类号
O59 [应用物理学];
学科分类号
摘要
Growth kinetics and behavior of dust particles in silane plasmas are studied using a new method combining an rf discharge modulation technique with two laser light scattering techniques. From the experiments, the following results are obtained: dust particles tend to be sustained around plasma/sheath boundaries near electrodes, especially the rf electrode; dust particles of a larger size exist in a lower space potential region near the rf electrode; dust size and density amount to 60 - 180 nm and 10(8) - 10(9) cm-3 in 1 - 2 s after the rf-power-on. The dust growth rate, which is high compared to the film deposition rate, can be explained by taking into account the contribution of positive-ion and/or neutral radical fluxes. The dust-trapping around the boundary can be explained by the balance between the electrostatic force and the ion drag force exerting on the particle. The effects of gas flow on dust motion and a dust suppression mechanism for rf modulated discharges are also discussed.
引用
收藏
页码:3074 / 3080
页数:7
相关论文
共 21 条
[1]   PARTICLE GENERATION AND BEHAVIOR IN A SILANE-ARGON LOW-PRESSURE DISCHARGE UNDER CONTINUOUS OR PULSED RADIOFREQUENCY EXCITATION [J].
BOUCHOULE, A ;
PLAIN, A ;
BOUFENDI, L ;
BLONDEAU, JP ;
LAURE, C .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (04) :1991-2000
[2]   MEASUREMENTS OF PARTICLE-SIZE KINETICS FROM NANOMETER TO MICROMETER SCALE IN A LOW-PRESSURE ARGON-SILANE RADIOFREQUENCY DISCHARGE [J].
BOUFENDI, L ;
PLAIN, A ;
BLONDEAU, JP ;
BOUCHOULE, A ;
LAURE, C ;
TOOGOOD, M .
APPLIED PHYSICS LETTERS, 1992, 60 (02) :169-171
[3]   ELECTROSTATIC TRAPPING OF CONTAMINATION PARTICLES IN A PROCESS PLASMA ENVIRONMENT [J].
CARLILE, RN ;
GEHA, S ;
OHANLON, JF ;
STEWART, JC .
APPLIED PHYSICS LETTERS, 1991, 59 (10) :1167-1169
[4]   LIMITATION OF ELECTROSTATIC CHARGING OF DUST PARTICLES IN A PLASMA [J].
GOERTZ, CK ;
IP, WH .
GEOPHYSICAL RESEARCH LETTERS, 1984, 11 (04) :349-352
[5]  
Hershkowitz N., 1989, PLASMA DIAGNOSTICS, V1, P130
[6]   COAGULATION OF DUST PARTICLES IN A PLASMA [J].
HORANYI, M ;
GOERTZ, CK .
ASTROPHYSICAL JOURNAL, 1990, 361 (01) :155-161
[7]   PARTICULATES IN ALUMINUM SPUTTERING DISCHARGES [J].
JELLUM, GM ;
GRAVES, DB .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6490-6496
[8]   MODULATION OF ELECTRON VELOCITY DISTRIBUTION FUNCTION BY MOVING CATHODE SHEATH IN A LOW-PRESSURE RF DISCHARGE [J].
OKUNO, Y ;
OHTSU, Y ;
FUJITA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (04) :1194-1198
[9]   POTENTIAL FORMATION NEAR POWERED ELECTRODE IN RADIO-FREQUENCY-DRIVEN DISCHARGE [J].
OKUNO, Y ;
FUJITA, H .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (02) :642-644
[10]   INSITU INFRARED DIAGNOSTICS OF PARTICLE FORMING ETCH PLASMAS [J].
ONEILL, JA ;
SINGH, J ;
GIFFORD, GG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (03) :1716-1721