THICKNESS MEASUREMENTS OF ADSORBED LAYERS BY AUGER-ELECTRON SPECTROSCOPY

被引：8

作者：

MARGONINSKI, Y ^{[1
]}

机构：

[1] HEBREW UNIV,RACAH INST PHYS,JERUSALEM 91000,ISRAEL

来源：

关键词：

D O I：

10.1016/0038-1098(75)90314-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：373 / 375

页数：3

共 8 条

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BRUNDLE, CR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :212-224

[2]

DORN R, 1974, SURF SCI, V42, P582

FAN, JCC ;

HENRICH, VE .

[4]

GREEN M, 1960, PROGRESS SEMICONDUCT, V4, P37

[5] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J].

PALMBERG, PW ;

RHODIN, TN .

[6]

PALMBERG PW, 1973, ANAL CHEM, V45, pA594

[7] QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY AND ELECTRON RANGES [J].

SEAH, MP .

TARNG, ML ;

WEHNER, GK .