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APPLICATION OF INFRARED-LASER PHOTOACOUSTIC-SPECTROSCOPY TO SURFACE STUDIES
被引:3
作者
:
COUFAL, H
论文数:
0
引用数:
0
h-index:
0
COUFAL, H
CHUANG, TJ
论文数:
0
引用数:
0
h-index:
0
CHUANG, TJ
TRAGER, F
论文数:
0
引用数:
0
h-index:
0
TRAGER, F
机构
:
来源
:
JOURNAL DE PHYSIQUE
|
1983年
/ 44卷
/ NC-6期
关键词
:
D O I
:
10.1051/jphyscol:1983647
中图分类号
:
学科分类号
:
摘要
:
引用
收藏
页码:297 / 300
页数:4
相关论文
共 5 条
[1]
ELECTRON-SPECTROSCOPY STUDY OF SILICON SURFACES EXPOSED TO XEF2 AND THE CHEMISORPTION OF SIF4 ON SILICON
CHUANG, TJ
论文数:
0
引用数:
0
h-index:
0
CHUANG, TJ
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2614
-
2619
[2]
Coufal H., 1981, IBM Technical Disclosure Bulletin, V23, P3861
[3]
Coufal H., 1980, IBM Technical Disclosure Bulletin, V22, P4681
[4]
OSCILLATING BEAM SPECTROMETER
SEKI, H
论文数:
0
引用数:
0
h-index:
0
SEKI, H
ITOH, U
论文数:
0
引用数:
0
h-index:
0
ITOH, U
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1980,
51
(01)
: 22
-
26
[5]
INFRARED-LASER PHOTO-ACOUSTIC SPECTROSCOPY FOR SURFACE STUDIES - SF6 INTERACTION WITH SILVER FILMS
TRAGER, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
TRAGER, F
COUFAL, H
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
COUFAL, H
CHUANG, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
CHUANG, TJ
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(23)
: 1720
-
1723
←
1
→
共 5 条
[1]
ELECTRON-SPECTROSCOPY STUDY OF SILICON SURFACES EXPOSED TO XEF2 AND THE CHEMISORPTION OF SIF4 ON SILICON
CHUANG, TJ
论文数:
0
引用数:
0
h-index:
0
CHUANG, TJ
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2614
-
2619
[2]
Coufal H., 1981, IBM Technical Disclosure Bulletin, V23, P3861
[3]
Coufal H., 1980, IBM Technical Disclosure Bulletin, V22, P4681
[4]
OSCILLATING BEAM SPECTROMETER
SEKI, H
论文数:
0
引用数:
0
h-index:
0
SEKI, H
ITOH, U
论文数:
0
引用数:
0
h-index:
0
ITOH, U
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1980,
51
(01)
: 22
-
26
[5]
INFRARED-LASER PHOTO-ACOUSTIC SPECTROSCOPY FOR SURFACE STUDIES - SF6 INTERACTION WITH SILVER FILMS
TRAGER, F
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
TRAGER, F
COUFAL, H
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
COUFAL, H
CHUANG, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,RES LAB,SAN JOSE,CA 95193
IBM CORP,RES LAB,SAN JOSE,CA 95193
CHUANG, TJ
[J].
PHYSICAL REVIEW LETTERS,
1982,
49
(23)
: 1720
-
1723
←
1
→