THERMAL-ANALYSIS OF NICKEL-OXIDE FILMS

被引:21
作者
BUKOVEC, P [1 ]
BUKOVEC, N [1 ]
OREL, B [1 ]
WISSIAK, KS [1 ]
机构
[1] INST CHEM,LJUBLJANA 61000,SLOVENIA
来源
JOURNAL OF THERMAL ANALYSIS | 1993年 / 40卷 / 03期
关键词
NICKEL OXIDE FILMS; SEMICONDUCTING MATERIALS;
D O I
10.1007/BF02546882
中图分类号
O414.1 [热力学];
学科分类号
摘要
Nickel oxide films were prepared by chemical deposition on glass substrates using nickel sulphate and potassium persulphate in ammonia solution. Coatings dried in air and at 85-degrees-C were characterized by thermal analysis (TG and DTG), FT-IR spectroscopy and X-ray diffraction. The films could be formulated as hydrated forms of 4Ni(OH)2.NiOOH and Ni3O2(OH)4 respectively. The coatings lost water and oxygen on heating to give NiO.
引用
收藏
页码:1193 / 1196
页数:4
相关论文
共 10 条
[1]  
Delichere P., 1988, SPIE, V1016, P165
[2]  
FERRARO JR, 1971, LOW FREQUENCY VIBRAT, P74
[3]  
Lampert C. M., 1984, SOLAR ENERGY MAT, V11, P27
[4]  
MACKENZIE RC, 1970, DIFFERENTIAL THERMAL, P271
[5]  
NAKAMOTO K, 1986, INFRARED SPECTRA INO
[6]   A CHEMICAL METHOD FOR THE DEPOSITION OF NICKEL-OXIDE THIN-FILMS [J].
PRAMANIK, P ;
BHATTACHARYA, S .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (12) :3869-3870
[7]   EFFECT OF STRUCTURE ON X-RAY PHOTOELECTRON-SPECTRA OF NICKEL OXIDES [J].
RECHTIN, MD ;
AVERBACH, BL .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1975, 36 (09) :893-897
[8]   PHOTOCONDUCTIVITY IN DISORDERED NICKEL-OXIDE FILMS [J].
TSU, R ;
ESAKI, L ;
LUDEKE, R .
PHYSICAL REVIEW LETTERS, 1969, 23 (17) :977-&
[9]  
YAMADA S, 1988, SPIE, V1016, P34
[10]  
1966, ANWENDUNGEN SCHWINGU, P91