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INFLUENCE OF WORK FUNCTION CHANGE DUE TO OXYGEN-CHEMISORPTION ON THE SECONDARY-ION EMISSION PROBABILITY

被引：2
作者：
UHLMANN, K
SCHMIDT, M
机构：
[1] Technische Univ Dresden, Sektion, Physik, Dresden, East Ger, Technische Univ Dresden, Sektion Physik, Dresden, East Ger
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1984年 / 85卷 / 01期
关键词：
D O I：
10.1002/pssa.2210850142
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
6
引用
收藏
页码：K19 / K22
页数：4
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[3]   SECONDARY-ION EMISSION PROBABILITY IN SPUTTERING [J].
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[4]  
SCHMIDT M, 1980, 8TH P IVC 4TH ICSS S, V35, P370
[5]  
SCHMIDT M, 1983, THESIS TU DRESDEN
[6]  
SPECKMANN W, 1982, SECONDARY ION MASS S, V3, P128
[7]   EFFECT OF SURFACE-CHEMISTRY AND WORK FUNCTION IN SECONDARY ION MASS-SPECTROMETRY [J].
YU, ML .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (02) :500-502
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