A CHARACTERIZATION STUDY OF PLATINUM TIN OXIDE-FILMS SUPPORTED ON AL2O3

被引:32
作者
HOFLUND, GB [1 ]
ASBURY, DA [1 ]
GILBERT, RE [1 ]
机构
[1] UNIV NEBRASKA,DEPT CHEM ENGN,LINCOLN,NE 68588
关键词
DEPTH PROFILING - TIN OXIDE;
D O I
10.1016/0040-6090(85)90102-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:139 / 150
页数:12
相关论文
共 54 条
[1]   CHARACTERIZATION OF PT-SN CATALYST FOR ELECTROCHEMICAL OXIDATION OF METHANOL [J].
ANDREW, MR ;
DRURY, JS ;
MCNICOL, BD ;
PINNINGTON, C ;
SHORT, RT .
JOURNAL OF APPLIED ELECTROCHEMISTRY, 1976, 6 (02) :99-106
[2]  
BACAUD R, 1975, CR ACAD SCI C CHIM, V281, P159
[3]   MOSSBAUER-SPECTRA INVESTIGATION OF THE ROLE OF TIN IN PLATINUM-TIN REFORMING CATALYSTS [J].
BACAUD, R ;
BUSSIERE, P ;
FIGUERAS, F .
JOURNAL OF CATALYSIS, 1981, 69 (02) :399-409
[4]  
Bacaud R., 1976, PREPARATION CATALYST, P509
[5]   MOSSBAUER-SPECTROMETRIC AND CATALYTIC INVESTIGATIONS OF SYSTEM PT-SN-ETA-AL2O3 [J].
BERNDT, H ;
MEHNER, H ;
VOLTER, J ;
MEISEL, W .
ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1977, 429 (02) :47-58
[6]   ELECTRON LOSS STUDY OF THE NATIVE OXIDE OF TIN [J].
BEVOLO, AJ ;
VERHOEVEN, JD ;
NOACK, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (04) :943-945
[7]   SURFACE COMPOSITION AND DEPTH CONCENTRATION PROFILE OF PLATINUM-TIN ALLOYS FROM COMBINED X-RAY PHOTOELECTRON AND AUGER SPECTROSCOPIC DATA [J].
BOUWMAN, R ;
BILOEN, P .
SURFACE SCIENCE, 1974, 41 (02) :348-358
[8]   AUGER SPECTROSCOPIC STUDY OF SURFACE COMPOSITION OF PT-SN ALLOYS IN ULTRAHIGH-VACUUM AND IN PRESENCE OF OXYGEN AND HYDROGEN [J].
BOUWMAN, R ;
TONEMAN, LH ;
HOLSCHER, AA .
SURFACE SCIENCE, 1973, 35 (01) :8-33
[10]   THE INTERACTION OF TIN OXIDE-FILMS WITH O2, H-2, NO, AND H2S [J].
CAPEHART, TW ;
CHANG, SC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (02) :393-397