SCANNING TUNNELLING AND ATOMIC FORCE MICROSCOPY PERFORMED WITH THE SAME PROBE IN ONE UNIT

被引：5

作者：

BRYANT, PJ ^{[1
]}

MILLER, RG ^{[1
]}

DEEKEN, R ^{[1
]}

YANG, R ^{[1
]}

ZHENG, YC ^{[1
]}

机构：

[1] UNIV MISSOURI,KANSAS CITY,MO 64110

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01460.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：871 / 875

页数：5

共 7 条

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HARRISON, WA .

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[5] EFFECT OF TIP MORPHOLOGY ON IMAGES OBTAINED BY SCANNING TUNNELING MICROSCOPY [J].

PARK, SI ;

NOGAMI, J ;

QUATE, CF .

PHYSICAL REVIEW B, 1987, 36 (05) :2863-2866

[6] TIP SURFACE INTERACTIONS IN STM AND AFM [J].

PETHICA, JB ;

OLIVER, WC .

PHYSICA SCRIPTA, 1987, T19A :61-66

[7] ATOMIC FORCE PROFILING BY UTILIZING CONTACT FORCES [J].

YANG, R ;

MILLER, R ;

BRYANT, PJ .

JOURNAL OF APPLIED PHYSICS, 1988, 63 (02) :570-572

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