学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
RESONANCE RAMAN-SCATTERING IN SI AT ELEVATED-TEMPERATURES
被引:118
作者
:
COMPAAN, A
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
COMPAAN, A
[
1
]
TRODAHL, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
TRODAHL, HJ
[
1
]
机构
:
[1]
MAX PLANCK INST FESTKORPERFORSCH,D-7000 STUTTGART 80,FED REP GER
来源
:
PHYSICAL REVIEW B
|
1984年
/ 29卷
/ 02期
关键词
:
D O I
:
10.1103/PhysRevB.29.793
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:793 / 801
页数:9
相关论文
共 23 条
[21]
von der Linde D., 1983, Laser-Solid Interactions and Transient Thermal Processing of Materials, P17
[22]
RAMAN-SCATTERING WITH NANOSECOND RESOLUTION DURING PULSED LASER ANNEALING OF SILICON
VONDERLINDE, D
论文数:
0
引用数:
0
h-index:
0
VONDERLINDE, D
WARTMANN, G
论文数:
0
引用数:
0
h-index:
0
WARTMANN, G
[J].
APPLIED PHYSICS LETTERS,
1982,
41
(08)
: 700
-
702
[23]
WARTMAN G, 1983, APPL PHYS LETT, V43, P613
←
1
2
3
→
共 23 条
[21]
von der Linde D., 1983, Laser-Solid Interactions and Transient Thermal Processing of Materials, P17
[22]
RAMAN-SCATTERING WITH NANOSECOND RESOLUTION DURING PULSED LASER ANNEALING OF SILICON
VONDERLINDE, D
论文数:
0
引用数:
0
h-index:
0
VONDERLINDE, D
WARTMANN, G
论文数:
0
引用数:
0
h-index:
0
WARTMANN, G
[J].
APPLIED PHYSICS LETTERS,
1982,
41
(08)
: 700
-
702
[23]
WARTMAN G, 1983, APPL PHYS LETT, V43, P613
←
1
2
3
→