THE PERCOLATION APPROACH TO THE DEVELOPMENT OF PULSED LASER EXPOSED POSITIVE PHOTORESISTS

被引:4
作者
BOGDANOV, AL
VALIEV, KA
VELIKOV, LV
ZAROSLOV, DY
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1987年 / 5卷 / 01期
关键词
D O I
10.1116/1.583911
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
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页码:391 / 395
页数:5
相关论文
共 5 条
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[Anonymous], 1984, INTRO PERCOLATION TH
[2]  
CHANDROSS EA, 1981, SOLID STATE TECHNOL, V24, P81
[3]   ULTRAFAST HIGH-RESOLUTION CONTACT LITHOGRAPHY WITH EXCIMER LASERS [J].
JAIN, K ;
WILLSON, CG ;
LIN, BJ .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1982, 26 (02) :151-159
[4]  
Lin B. J., 1980, FINE LINE LITHOGRAPH
[5]   SELF-DEVELOPING PHOTOETCHING OF POLY(ETHYLENE-TEREPHTHALATE) FILMS BY FAR ULTRAVIOLET EXCIMER LASER-RADIATION [J].
SRINIVASAN, R ;
MAYNEBANTON, V .
APPLIED PHYSICS LETTERS, 1982, 41 (06) :576-578