HIGH-RESOLUTION MEASUREMENTS OF ANGLE-RESOLVED X-RAY-SCATTERING FROM OPTICALLY FLAT MIRRORS

被引：19

作者：

MATSUSHITA, T ^{[1
]}

ISHIKAWA, T ^{[1
]}

KOHRA, K ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT APPL PHYS,BUNKYO KU,TOKYO 113,JAPAN

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1984年 / 17卷 / AUG期

关键词：

D O I：

10.1107/S002188988401147X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：257 / 264

页数：8

共 31 条

[1]

ASCHENBACH B, 1981, P SOC PHOTO OPT INST, V316, P186

[2]

Beckmann P., 1963, SCATTERING ELECTROMA

[3] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J].

BENNETT, HE ;

PORTEUS, JO .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) :123-+

[4] MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER [J].

BENNETT, JM .

APPLIED OPTICS, 1976, 15 (11) :2705-2721

[5] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&

[6] SMALL ANGLE X-RAY SCATTERING BY SPHERICAL PARTICLES OF POLYSTYRENE AND POLYVINYLTOLUENE [J].

BONSE, U ;

HART, M .

ZEITSCHRIFT FUR PHYSIK, 1966, 189 (02) :151-&

[7]

Church E. L., 1979, P SOC PHOTO-OPT INS, V184, P196

[8] RELATIONSHIP BETWEEN SURFACE SCATTERING AND MICROTOPOGRAPHIC FEATURES [J].

CHURCH, EL ;

JENKINSON, HA ;

ZAVADA, JM .

OPTICAL ENGINEERING, 1979, 18 (02) :125-136

[9] MEASUREMENT OF FINISH OF DIAMOND-TURNED METAL-SURFACES BY DIFFERENTIAL LIGHT-SCATTERING [J].

CHURCH, EL ;

JENKINSON, HA ;

ZAVADA, JM .

OPTICAL ENGINEERING, 1977, 16 (04) :360-374

[10]

COMPTON AH, 1957, XRAYS THEORY EXPT, P711

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