DESIGN OF AN APPARATUS FOR HIGH-RESOLUTION MEASUREMENTS OF ATOMIC AND MOLECULAR LIFETIMES BY HIGH-FREQUENCY DEFLECTION TECHNIQUE

被引：20

作者：

ERMAN, P ^{[1
]}

BRZOZOWSKI, J ^{[1
]}

机构：

[1] RES INST PHYS,POB,S-10405 STOCKHOLM,SWEDEN

来源：

PHYSICA SCRIPTA | 1975年 / 12卷 / 04期

关键词：

D O I：

10.1088/0031-8949/12/4/001

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：177 / 182

页数：6

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