ANGLE-OF-INCIDENCE DEPENDENCE IN ANGLE-RESOLVED PHOTOEMISSION FROM CHEMISORBED MOLECULES - C(2X2)O, C(2X2)S, AND CO ON NI(100)

被引：69

作者：

WEEKS, SP

PLUMMER, EW

机构：

[1] UNIV PENN,DEPT PHYS,PHILADELPHIA,PA 19174

[2] UNIV PENN,RES STRUCTURE MATTER LAB,PHILADELPHIA,PA 19174

来源：

SOLID STATE COMMUNICATIONS | 1977年 / 21卷 / 08期

关键词：

D O I：

10.1016/0038-1098(77)91130-9

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：695 / 699

页数：5

共 15 条

[1] ULTRAVIOLET PHOTOIONIZATION CROSS-SECTIONS FOR N2 AND CO [J].

DAVENPORT, JW .

PHYSICAL REVIEW LETTERS, 1976, 36 (16) :945-949

[2] CRYSTALLOGRAPHIC DEPENDENCE OF CHEMISORPTION BONDING FOR SULFUR ON (001), (110), AND (111) NICKEL [J].

DEMUTH, JE ;

JEPSEN, DW ;

MARCUS, PM .

PHYSICAL REVIEW LETTERS, 1974, 32 (21) :1182-1185

[3] CHEMISORPTION ON (001), (110) AND (111) NICKEL SURFACES - CORRELATED STUDY USING LEED SPECTRA, AUGER-SPECTRA AND WORK FUNCTION CHANGE MEASUREMENTS [J].

DEMUTH, JE ;

RHODIN, TN .

SURFACE SCIENCE, 1974, 45 (01) :249-307

[4] CHEMISORPTION BONDING OF C(2 BY 2) CHALCOGEN OVERLAYERS ON NI(001) [J].

DEMUTH, JE ;

JEPSEN, DW ;

MARCUS, PM .

PHYSICAL REVIEW LETTERS, 1973, 31 (08) :540-542

[5] PHOTOEMISSION ENERGY-LEVEL MEASUREMENTS OF CHEMISORBED CO AND O ON NI [J].

EASTMAN, DE ;

CASHION, JK .

PHYSICAL REVIEW LETTERS, 1971, 27 (22) :1520-&

[6] SURFACE MOLECULES AND CHEMISORPTION .2. PHOTOEMISSION ANGULAR-DISTRIBUTIONS [J].

GADZUK, JW .

PHYSICAL REVIEW B, 1974, 10 (12) :5030-5044

[7] ANGULAR-DISTRIBUTIONS OF ELECTRONS PHOTOEMITTED FROM CHEMISORBED ATOMS [J].

GADZUK, JW .

SOLID STATE COMMUNICATIONS, 1974, 15 (06) :1011-1016

[8] INTERPRETATION OF PHOTOELECTRON-SPECTRA OF MOLECULARLY ADSORBED CO [J].

GUSTAFSSON, T ;

PLUMMER, EW ;

EASTMAN, DE ;

FREEOUF, JL .

SOLID STATE COMMUNICATIONS, 1975, 17 (03) :391-396

[9] ELECTRONIC CHARACTERIZATION OF SOLID SURFACES [J].

HAGSTRUM, HD .

SCIENCE, 1972, 178 (4058) :275-&

[10] OPTICAL PROPERTIES OF SOME TRANSITION METALS [J].

JUENKER, DW ;

LEBLANC, LJ ;

MARTIN, CR .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1968, 58 (02) :164-&

← 1 2 →