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DEPOSITION OF TITANIUM NITRIDE ON SURFACE-HARDENED STRUCTURAL-STEEL BY REACTIVE MAGNETRON SPUTTERING
被引:16
作者
:
ALJAROUDI, MY
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
ALJAROUDI, MY
HENTZELL, HTG
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
HENTZELL, HTG
HORNSTROM, SE
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
HORNSTROM, SE
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
BENGTSON, A
机构
:
[1]
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
[2]
SWEDISH INST MET RES,S-11428 STOCKHOLM,SWEDEN
来源
:
THIN SOLID FILMS
|
1989年
/ 182卷
关键词
:
D O I
:
10.1016/0040-6090(89)90252-6
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:153 / 166
页数:14
相关论文
共 16 条
[1]
THE INFLUENCE OF TITANIUM NITRIDE SPUTTER DEPOSITION TEMPERATURE ON SURFACE-HARDENED 2.5-PERCENT SILICON-IRON
ALJAROUDI, MY
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
ALJAROUDI, MY
HENTZELL, HTG
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
HENTZELL, HTG
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
BENGTSON, A
[J].
THIN SOLID FILMS,
1989,
170
(02)
: 293
-
307
[2]
IN-DEPTH COMPOSITIONAL PROFILE ANALYSIS OF ALLOYS USING OPTICAL EMISSION GLOW-DISCHARGE SPECTROGRAPHY
BELLE, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,ADV REACTORS DIV,NUCL ENERGY SYST,MADISON,PA 15663
BELLE, CJ
JOHNSON, JD
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,ADV REACTORS DIV,NUCL ENERGY SYST,MADISON,PA 15663
JOHNSON, JD
[J].
APPLIED SPECTROSCOPY,
1973,
27
(02)
: 118
-
124
[3]
A CONTRIBUTION TO THE SOLUTION OF THE PROBLEM OF QUANTIFICATION IN SURFACE-ANALYSIS WORK USING GLOW-DISCHARGE ATOMIC EMISSION-SPECTROSCOPY
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
BENGTSON, A
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1985,
40
(04)
: 631
-
639
[4]
DEPTH PROFILING OF THIN-FILMS USING A GRIMM-TYPE GLOW-DISCHARGE LAMP
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
BENGTSON, A
DANIELSSON, L
论文数:
0
引用数:
0
h-index:
0
DANIELSSON, L
[J].
THIN SOLID FILMS,
1985,
124
(3-4)
: 231
-
236
[5]
STUDIES OF SPUTTERING IN A GLOW-DISCHARGE FOR SPECTROCHEMICAL ANALYSIS
BOUMANS, PWJ
论文数:
0
引用数:
0
h-index:
0
BOUMANS, PWJ
[J].
ANALYTICAL CHEMISTRY,
1972,
44
(07)
: 1219
-
&
[6]
FUNNSJO G, 1980, SCAND J METALL, P205
[7]
FUNNSJO G, 1980, SCAND J METALL, P199
[8]
GLASKI FA, 1972, 3RD P INT C CHEM VAP, P340
[9]
GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR ANALYSIS OF THIN-FILMS
GREENE, JE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
GREENE, JE
WHELAN, JM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
WHELAN, JM
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(06)
: 2509
-
2513
[10]
NEW GLOW DISCHARGE LAMP FOR OPTICAL EMISSION SPECTRAL ANALYSIS
GRIMM, W
论文数:
0
引用数:
0
h-index:
0
GRIMM, W
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1968,
B 23
(07)
: 443
-
&
←
1
2
→
共 16 条
[1]
THE INFLUENCE OF TITANIUM NITRIDE SPUTTER DEPOSITION TEMPERATURE ON SURFACE-HARDENED 2.5-PERCENT SILICON-IRON
ALJAROUDI, MY
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
ALJAROUDI, MY
HENTZELL, HTG
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
HENTZELL, HTG
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
机构:
LINKOPING UNIV,DEPT PHYS & MEASUREMENT TECHNOL,THIN FILM GRP,S-58183 LINKOPING,SWEDEN
BENGTSON, A
[J].
THIN SOLID FILMS,
1989,
170
(02)
: 293
-
307
[2]
IN-DEPTH COMPOSITIONAL PROFILE ANALYSIS OF ALLOYS USING OPTICAL EMISSION GLOW-DISCHARGE SPECTROGRAPHY
BELLE, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,ADV REACTORS DIV,NUCL ENERGY SYST,MADISON,PA 15663
BELLE, CJ
JOHNSON, JD
论文数:
0
引用数:
0
h-index:
0
机构:
WESTINGHOUSE ELECT CORP,ADV REACTORS DIV,NUCL ENERGY SYST,MADISON,PA 15663
JOHNSON, JD
[J].
APPLIED SPECTROSCOPY,
1973,
27
(02)
: 118
-
124
[3]
A CONTRIBUTION TO THE SOLUTION OF THE PROBLEM OF QUANTIFICATION IN SURFACE-ANALYSIS WORK USING GLOW-DISCHARGE ATOMIC EMISSION-SPECTROSCOPY
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
BENGTSON, A
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1985,
40
(04)
: 631
-
639
[4]
DEPTH PROFILING OF THIN-FILMS USING A GRIMM-TYPE GLOW-DISCHARGE LAMP
BENGTSON, A
论文数:
0
引用数:
0
h-index:
0
BENGTSON, A
DANIELSSON, L
论文数:
0
引用数:
0
h-index:
0
DANIELSSON, L
[J].
THIN SOLID FILMS,
1985,
124
(3-4)
: 231
-
236
[5]
STUDIES OF SPUTTERING IN A GLOW-DISCHARGE FOR SPECTROCHEMICAL ANALYSIS
BOUMANS, PWJ
论文数:
0
引用数:
0
h-index:
0
BOUMANS, PWJ
[J].
ANALYTICAL CHEMISTRY,
1972,
44
(07)
: 1219
-
&
[6]
FUNNSJO G, 1980, SCAND J METALL, P205
[7]
FUNNSJO G, 1980, SCAND J METALL, P199
[8]
GLASKI FA, 1972, 3RD P INT C CHEM VAP, P340
[9]
GLOW-DISCHARGE OPTICAL SPECTROSCOPY FOR ANALYSIS OF THIN-FILMS
GREENE, JE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
GREENE, JE
WHELAN, JM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007
WHELAN, JM
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(06)
: 2509
-
2513
[10]
NEW GLOW DISCHARGE LAMP FOR OPTICAL EMISSION SPECTRAL ANALYSIS
GRIMM, W
论文数:
0
引用数:
0
h-index:
0
GRIMM, W
[J].
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY,
1968,
B 23
(07)
: 443
-
&
←
1
2
→