RANGES OF 0.7-2.1 KEV HYDROGEN-IONS IN BE, C AND SI

被引：19

作者：

ROSS, GG ^{[1
]}

TERREAULT, B ^{[1
]}

机构：

[1] UNIV QUEBEC,INST NATL RECH SCI ENERGIE,VARENNES J0L 2P0,QUEBEC,CANADA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 15卷 / 1-6期

关键词：

D O I：

10.1016/0168-583X(86)90253-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：61 / 65

页数：5

共 15 条

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[5]

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[6] NEW PRECISION TECHNIQUE FOR MEASURING CONCENTRATION VERSUS DEPTH OF HYDROGEN IN SOLIDS [J].

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[7]

LINDHARD J, 1963, K DAN VIDENSK SELSK, V33

[8]

LINDHARD J, 1968, K DAN VIDENSK SELSK, V36

[9]

LUKKAINEN A, 1982, RADIAT EFF, V59, P113

[10] SECONDARY ION MASS-SPECTROMETRY AND ITS RELATION TO HIGH-ENERGY ION-BEAM ANALYSIS TECHNIQUES [J].

MAGEE, CW .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3) :297-307

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