SECONDARY ION MASS-SPECTROMETRY AND ITS RELATION TO HIGH-ENERGY ION-BEAM ANALYSIS TECHNIQUES

被引：27

作者：

MAGEE, CW

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1981年 / 191卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(81)91019-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：297 / 307

页数：11

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