共 8 条
[1]
BOON DM, EXPT MECHANICS, V15, P295
[2]
ERF RJ, 1978, SPECKLE METROLOGY, P68
[4]
OPTICAL METHOD FOR MEASURING CONTOUR SLOPES OF AN OBJECT
[J].
APPLIED OPTICS,
1978, 17 (01)
:128-131
[5]
HUNG YY, 1979, APPL OPTICS, V10, P1048
[7]
IMAGE-SHEARING SPECKLE-PATTERN INTERFEROMETER FOR MEASURING BENDING MOMENTS
[J].
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS,
1973, 6 (11)
:1107-1110