ACOUSTOELECTRIC MEASUREMENTS OF MINORITY AND MAJORITY CARRIER MOBILITIES IN SEMICONDUCTORS INCLUDING HG1-XCDXTE

被引：10

作者：

TABIBAZAR, M ^{[1
]}

DAS, P ^{[1
]}

机构：

[1] RENSSELAER POLYTECH INST,DEPT ELECT COMP & SYST ENGN,TROY,NY 12180

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1988年 / 45卷 / 02期

关键词：

D O I：

10.1007/BF02565198

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：119 / 124

页数：6

相关论文

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