DETERMINATION OF MINORITY-CARRIER LIFETIMES OF BIPOLAR-TRANSISTORS FROM LOW-CURRENT HFE FALL-OFF

被引：8

作者：

CHAMBERLAIN, NG ^{[1
]}

ROULSTON, DJ ^{[1
]}

机构：

[1] UNIV WATERLOO, DEPT ELECT ENGN, WATERLOO N2L 3G1, ONTARIO, CANADA

来源：

关键词：

D O I：

10.1109/T-ED.1976.18662

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1346 / 1348

页数：3

共 7 条

BAKANOWSKI, AE ;

FORSTER, JH .

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CHAMBERLAIN, NG ;

ROULSTON, DJ .

[3]

HAJJ I, 1974, CIRCUIT THEORY APPL, V2, P133

REDDI, VGK .

ROULSTON, DJ ;

SEHGAL, J ;

CHAMBERL.SG .

SAH, CT ;

NOYCE, RN ;

SHOCKLEY, W .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1957, 45 (09) :1228-1243

[7]

SAH CT, 1962, IRE T ELECTRON DEV, VED9, P94, DOI DOI 10.1109/T-ED.1962.14895