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NATURE OF WAVELENGTH CHIRPING IN DIRECTLY MODULATED SEMICONDUCTOR-LASERS
被引:249
作者
:
KOCH, TL
论文数:
0
引用数:
0
h-index:
0
KOCH, TL
BOWERS, JE
论文数:
0
引用数:
0
h-index:
0
BOWERS, JE
机构
:
来源
:
ELECTRONICS LETTERS
|
1984年
/ 20卷
/ 25-2期
关键词
:
D O I
:
10.1049/el:19840709
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1038 / 1040
页数:3
相关论文
共 5 条
[1]
BOWERS JE, 1984, 13 INT QUANT EL C AN
[2]
MEASUREMENT OF THE LINEWIDTH ENHANCEMENT FACTOR-ALPHA OF SEMICONDUCTOR-LASERS
HARDER, C
论文数:
0
引用数:
0
h-index:
0
HARDER, C
VAHALA, K
论文数:
0
引用数:
0
h-index:
0
VAHALA, K
YARIV, A
论文数:
0
引用数:
0
h-index:
0
YARIV, A
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(04)
: 328
-
330
[3]
THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS
HENRY, CH
论文数:
0
引用数:
0
h-index:
0
HENRY, CH
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1982,
18
(02)
: 259
-
264
[4]
TRANSIENT CHIRPING IN SINGLE-FREQUENCY LASERS - LIGHTWAVE SYSTEMS CONSEQUENCES
LINKE, RA
论文数:
0
引用数:
0
h-index:
0
LINKE, RA
[J].
ELECTRONICS LETTERS,
1984,
20
(11)
: 472
-
474
[5]
MARCUSE D, 1983, IEEE J QUANTUM ELECT, V19, P228
←
1
→
共 5 条
[1]
BOWERS JE, 1984, 13 INT QUANT EL C AN
[2]
MEASUREMENT OF THE LINEWIDTH ENHANCEMENT FACTOR-ALPHA OF SEMICONDUCTOR-LASERS
HARDER, C
论文数:
0
引用数:
0
h-index:
0
HARDER, C
VAHALA, K
论文数:
0
引用数:
0
h-index:
0
VAHALA, K
YARIV, A
论文数:
0
引用数:
0
h-index:
0
YARIV, A
[J].
APPLIED PHYSICS LETTERS,
1983,
42
(04)
: 328
-
330
[3]
THEORY OF THE LINEWIDTH OF SEMICONDUCTOR-LASERS
HENRY, CH
论文数:
0
引用数:
0
h-index:
0
HENRY, CH
[J].
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1982,
18
(02)
: 259
-
264
[4]
TRANSIENT CHIRPING IN SINGLE-FREQUENCY LASERS - LIGHTWAVE SYSTEMS CONSEQUENCES
LINKE, RA
论文数:
0
引用数:
0
h-index:
0
LINKE, RA
[J].
ELECTRONICS LETTERS,
1984,
20
(11)
: 472
-
474
[5]
MARCUSE D, 1983, IEEE J QUANTUM ELECT, V19, P228
←
1
→