STUDY OF SOME OPTICAL AND ELECTRICAL-PROPERTIES OF HEAVILY DOPED SILICON LAYERS

被引:7
作者
SLAOUI, A
FOGARASSY, E
MULLER, JC
SIFFERT, P
机构
来源
JOURNAL DE PHYSIQUE | 1983年 / 44卷 / NC-5期
关键词
D O I
10.1051/jphyscol:1983509
中图分类号
学科分类号
摘要
引用
收藏
页码:65 / 71
页数:7
相关论文
共 20 条
[1]  
BORDFFKA H, 1980, LASER ELECTRON BEAM, P178
[2]  
FOGARASSY E, 1980, LASER ELECTRON BEAM, P117
[3]  
Greenaway D.L., 1968, OPTICAL PROPERTIES B
[4]  
HILL C, 1982, LASER ANNEALING SEMI, P511
[5]  
Hovel H.J., 1975, SEMICONDUCTORS SEMIM, V11
[6]  
LEITOILA A, 1979, APPL PHYS LETT, V35, P532
[7]  
MCGILL TC, 1970, J APPL PHYS, V14, P246
[8]   MEASUREMENT OF THE MINORITY-CARRIER TRANSPORT PARAMETERS IN HEAVILY DOPED SILICON [J].
MERTENS, RP ;
VANMEERBERGEN, JL ;
NIJS, JF ;
VANOVERSTRAETEN, RJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (05) :949-955
[9]  
MILLER GL, 1978, COMMUNICATION
[10]  
MOTOOKA T, 1982, J ELECTROCHEM SOC MO