USE OF ANOMALOUS DIFFRACTION, DAFS AND DANES TECHNIQUES FOR SITE-SELECTIVE SPECTROSCOPY OF COMPLEX OXIDES

被引:27
作者
VACINOVA, J [1 ]
HODEAU, JL [1 ]
WOLFERS, P [1 ]
LAURIAT, JP [1 ]
ELKAIM, E [1 ]
机构
[1] LAB UTILISAT RAYONNEMENT ELECTROMAGNET,CNRS,F-91405 ORSAY,FRANCE
关键词
DIFFRACTION ANOMALOUS FINE STRUCTURE; ANOMALOUS SCATTERING; ABSORPTION CORRECTION; MULTIWAVELENGTH REFINEMENT;
D O I
10.1107/S0909049595007886
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The diffraction anomalous fine structure (DAFS) technique is applied to highly absorbing 'real' crystals of arbitrary shape containing several heavy atoms. A multiwavelength refinement procedure of DAFS signals is demonstrated on two different oxides, BaPt1-2x4+(Pt1-y2+Bay2+)(x)O-3-3x with x = 0.25, y similar or equal to 0 and BaZnFe6O11, which have complex crystallographic structures. In these compounds, anomalous scatterers are located in different crystallographic sites and thus a multiwavelength refinement is necessary to separate out the site-selective information. An accurate absorption correction procedure for small, highly absorbing single crystals necessary for the DAFS analysis of this kind of samples is also presented.
引用
收藏
页码:236 / 244
页数:9
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