TRANSPORT OF OXYGEN IN AMORPHOUS-GE THIN-FILMS DURING ANNEALING

[1] Barna A., 1972, J NONCRYSTALL SOLIDS, V8-10, P36, DOI DOI 10.1016/0022-3093(72)90114-7

[2] HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (26) : 1794 - &

[3] IONIZATION SPECTROMETER FOR ELEMENTAL ANALYSIS OF SURFACES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 151 - &

[4] OBSERVATION OF STRONG BULK OXIDATION EFFECTS IN AMORPHOUS-GERMANIUM BY ULTRAVIOLET REFLECTANCE SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1974, 24 (07) : 318 - 320

[5] KNOTEK ML, 1973, PHYS REV LETT, V30, P652, DOI 10.1103/PhysRevLett.30.652

[6] KNOTEK ML, 1974, 20 P IBM C TETR BOND

[7] OXYGEN-UPTAKE OF OBLIQUELY DEPOSITED GE FILMS [J]. APPLIED PHYSICS LETTERS, 1974, 25 (02) : 101 - 103

[8] PAESLER MA, 1974, 20 P IBM C TETR BOND

[1] Barna A., 1972, J NONCRYSTALL SOLIDS, V8-10, P36, DOI DOI 10.1016/0022-3093(72)90114-7

[2] HIGH-RESOLUTION ELECTRON MICROSCOPE OBSERVATION OF VOIDS IN AMORPHOUS GE [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (26) : 1794 - &

[3] IONIZATION SPECTROMETER FOR ELEMENTAL ANALYSIS OF SURFACES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (01) : 151 - &

[4] OBSERVATION OF STRONG BULK OXIDATION EFFECTS IN AMORPHOUS-GERMANIUM BY ULTRAVIOLET REFLECTANCE SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1974, 24 (07) : 318 - 320

[5] KNOTEK ML, 1973, PHYS REV LETT, V30, P652, DOI 10.1103/PhysRevLett.30.652

[6] KNOTEK ML, 1974, 20 P IBM C TETR BOND

[7] OXYGEN-UPTAKE OF OBLIQUELY DEPOSITED GE FILMS [J]. APPLIED PHYSICS LETTERS, 1974, 25 (02) : 101 - 103

[8] PAESLER MA, 1974, 20 P IBM C TETR BOND