ATOMIC-RESOLUTION IN PHOTON-EMISSION INDUCED BY A SCANNING TUNNELING MICROSCOPE

被引：113

作者：

BERNDT, R ^{[1
]}

GAISCH, R ^{[1
]}

SCHNEIDER, WD ^{[1
]}

GIMZEWSKI, JK ^{[1
]}

REIHL, B ^{[1
]}

SCHLITTLER, RR ^{[1
]}

TSCHUDY, M ^{[1
]}

机构：

[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

PHYSICAL REVIEW LETTERS | 1995年 / 74卷 / 01期

关键词：

D O I：

10.1103/PhysRevLett.74.102

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A low-temperature ultrahigh-vacuum scanning tunneling microscope (STM) is used to excite photon emission from Au(110) surfaces. In the detected photon intensity the (1 × 2) reconstruction of the Au surface is clearly resolved. This first observation of atomic resolution in STM-induced photon emission is interpreted in terms of local variations of the electromagnetic interaction of tip and sample occurring at constant tunneling current. Similar effects are expected to affect other scanning probe methods, in particular those involving photons. © 1994 The American Physical Society.

引用

页码：102 / 105

页数：4

共 22 条

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