A NEW APPROACH TO THE MEASUREMENT OF X-RAY STRUCTURE AMPLITUDES DETERMINED BY THE PENDELLOSUNG METHOD

被引：16

作者：

DEUTSCH, M ^{[1
]}

HART, M ^{[1
]}

机构：

[1] UNIV LONDON KINGS COLL, WHEATSTONE LAB, LONDON WC2R 2LS, ENGLAND

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1985年 / 41卷 / JAN期

关键词：

D O I：

10.1107/S0108767385000083

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：48 / 55

页数：8

共 25 条

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