SURFACE-ANALYSIS - X-RAY PHOTO-ELECTRON SPECTROSCOPY, AUGER-ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY

被引：39

作者：

TURNER, NH ^{[1
]}

COLTON, RJ ^{[1
]}

机构：

[1] USN, RES LAB, DIV CHEM, WASHINGTON, DC 20375 USA

来源：

ANALYTICAL CHEMISTRY | 1982年 / 54卷 / 05期

关键词：

D O I：

10.1021/ac00242a027

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：R293 / R322

页数：30

共 919 条

[11] FREE-ATOM-METAL SHIFTS IN THE M4,N-5(4), N-5(4,5) AUGER-SPECTRA OF AG, CD, IN, SN, SB, AND TE
AKSELA, S
KUMPULA, R
AKSELA, H
VAYRYNEN, J
NIEMINEN, RM
PUSKA, M
[J]. PHYSICAL REVIEW B, 1981, 23 (09): : 4362 - 4368
[12] SOLID-STATE SHIFTS IN THE L3M4,5M4,5 AUGER-SPECTRA OF THE ELEMENTS CU TO SE
AKSELA, S
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1981, 24 (01) : 91 - 94
[13] L2,3M2,3M2,3 AND L2,3M2,3N1 AUGER-SPECTRA OF FREE POTASSIUM ATOMS
AKSELA, S
KELLOKUMPU, M
AKSELA, H
VAYRYNEN, J
[J]. PHYSICAL REVIEW A, 1981, 23 (05) : 2374 - 2380
[14] SILICATE AND PHOSPHATE ADSORPTION ON GIBBSITE STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY ANGULAR-DISTRIBUTIONS
ALVAREZ, R
FADLEY, CS
SILVA, JA
[J]. SOIL SCIENCE SOCIETY OF AMERICA JOURNAL, 1980, 44 (02) : 422 - 425
[15] SURFACE MODIFICATION OF LOW-DENSITY POLYETHYLENE IN A FLUORINE-GAS PLASMA
ANAND, M
COHEN, RE
BADDOUR, RF
[J]. POLYMER, 1981, 22 (03) : 361 - 371
[16] ANDERSEN HH, 1979, APPL PHYS, V18, P139
[17] THE INFLUENCE OF THE BACKGROUND ON THE AUGER SIGNAL IN STUDIES OF FILM GROWTH
ANDERSSON, TG
[J]. THIN SOLID FILMS, 1981, 83 (02) : L147 - L149
[18] A XPS STUDY OF FE1-XCUXCR2S4
ANDO, K
[J]. SOLID STATE COMMUNICATIONS, 1980, 36 (02) : 165 - 166
[19] SOME ASPECTS OF BONDING AND BINDING IN POLYMERIC CHAINS
ANDRE, JM
BREDAS, JL
DELHALLE, J
[J]. INTERNATIONAL JOURNAL OF QUANTUM CHEMISTRY, 1981, 19 (06) : 1105 - 1111
[20] A COMBINED STUDY BY XPS, RAMAN, DIFFUSE REFLECTANCE SPECTROSCOPY AND ANALYTICAL ELECTRON-MICROSCOPY OF THE INFLUENCE OF THE SEQUENCE OF IMPREGNATION ON THE STATE AND DISPERSION OF COBALT IN COMO-AL2O3 CATALYSTS
APECETCHE, MA
HOUALLA, M
DELMON, B
[J]. SURFACE AND INTERFACE ANALYSIS, 1981, 3 (02) : 90 - 93

← 1 2 3 4 5 6 7 8 9 10 →