EVOLUTION AND ACCOMPLISHMENTS OF VLSI YIELD MANAGEMENT AT IBM

被引：17

作者：

STAPPER, CH

CASTRUCCI, PP

MAEDER, RA

ROWE, WE

VERHELST, RA

机构：

来源：

IBM JOURNAL OF RESEARCH AND DEVELOPMENT | 1982年 / 26卷 / 05期

关键词：

INTEGRATED CIRCUITS; VLSI;

D O I：

10.1147/rd.265.0532

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：532 / 545

页数：14

共 33 条

[1] COMPUTATION OF INTEGRATED-CIRCUIT YIELDS FROM DISTRIBUTION OF SLICE YIELDS FOR INDIVIDUAL DEVICES [J].

ANSLEY, WG .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1968, ED15 (06) :405-&

[2] IC YIELD PROBLEM - TENTATIVE ANALYSIS FOR MOS-SOS CIRCUITS [J].

BERNARD, J .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (08) :939-944

[3]

BINDELS JFM, 1981, IEEE ISSCC DIGEST, V24, P82

[4] FAULT-TOLERANT 64K DYNAMIC RANDOM-ACCESS MEMORY [J].

CENKER, RP ;

CLEMONS, DG ;

HUBER, WR ;

PETRIZZI, JB ;

PROCYK, FJ ;

TROUT, GM .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (06) :853-860

[5]

CENKER RP, 1979, 1979 IEEE ISSCC DIGE, V22, P150

[6] SOLID LOGIC TECHNOLOGY - VERSATILE HIGH-PERFORMANCE MICROELECTRONICS [J].

DAVIS, EM ;

HARDING, WE ;

SCHWARTZ, RS ;

CORNING, JJ .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (02) :102-&

[7]

DENNARD RH, 1966, RC1552 IBM TJ WATS R

[8]

EATON S, 1981, IEEE INT C SOL STAT, V24, P84

[9] FEATURE SIZE CONTROL IN IC MANUFACTURING [J].

FRASCH, P ;

SAREMSKI, KH .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1982, 26 (05) :561-567

[10] REDUCTION OF LEAKAGE BY IMPLANTATION GETTERING IN VLSI CIRCUITS [J].

GEIPEL, HJ ;

TICE, WK .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1980, 24 (03) :310-317

← 1 2 3 4 →