AES, XPS AND TEM CHARACTERIZATION OF BORON-NITRIDE DEPOSITED UNDER CHEMICAL VAPOR INFILTRATION (CVI) CONDITIONS

被引:10
作者
DUGNE, O
PROUHET, S
GUETTE, A
NASLAIN, R
FOURMEAUX, R
HSSEIN, K
SEVELY, J
GUIMON, C
GONBEAU, D
PFISTERGUILLOUZO, G
机构
[1] CNRS,OPT ELECTR LAB,F-31055 TOULOUSE,FRANCE
[2] UNIV PAU & PAYS ADOUR,PHYS CHIM MOLEC LAB,CNRS,UNITE 474,F-64000 PAU,FRANCE
来源
JOURNAL DE PHYSIQUE | 1989年 / 50卷 / C-5期
关键词
D O I
10.1051/jphyscol:1989540
中图分类号
学科分类号
摘要
引用
收藏
页码:333 / 341
页数:9
相关论文
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