DIRECT ELECTRON-MICROSCOPIC IMAGING OF SURFACE-TOPOGRAPHY BY DIFFRACTION AND PHASE-CONTRAST

被引：16

作者：

LEHMPFUHL, G ^{[1
]}

WARBLE, CE ^{[1
]}

机构：

[1] CSIRO,DIV CHEM PHYS,CLAYTON,VIC 3168,AUSTRALIA

来源：

关键词：

D O I：

10.1016/0304-3991(86)90202-0

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：135 / 146

页数：12

共 18 条

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[13] ELECTRON MICROSCOPIC INVESTIGATIONS OF MGO MORPHOLOGY AND SURFACES
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WARBLE, CE
[J]. JOURNAL OF CRYSTAL GROWTH, 1971, 10 (01) : 26 - &
[14] MOODIE AF, 1975, MATERIALS SCI RESEAR, V10, P1
[15] MOODIE AF, COMMUNICATION
[16] Segall R.L., 1980, 7 EUR C EL MICR, V1, P392
[17] DIRECT ATOMIC IMAGING OF SOLID-SURFACES .3. SMALL PARTICLES AND EXTENDED AU SURFACES
SMITH, DJ
MARKS, LD
[J]. ULTRAMICROSCOPY, 1985, 16 (01) : 101 - 113
[18] WARBLE CE, 1984, ACTA CRYST A SC, V40, P389