METHOD FOR COMPLEX-X-RAY DIFFRACTION ANALYSIS OF TIN COATINGS

被引：19

作者：

VALVODA, V

CERNY, R

KUZEL, R

DOBIASOVA, L

机构：

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1987年 / 22卷 / 10期

关键词：

D O I：

10.1002/crat.2170221017

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：1301 / 1311

页数：11

共 20 条

[1]

ALLAN CG, 1974, UKAEA TRG2548 REP

[2] DETERMINATION OF MOLAR RATIO IN AB1-X ROCK-SALT-TYPE COMPOUNDS BY X-RAY-POWDER DIFFRACTION METHOD - APPLICATION TO TIC1-X [J].

CAPKOVA, P ;

KAREN, P ;

DOBIASOVA, L .

CRYSTAL RESEARCH AND TECHNOLOGY, 1986, 21 (06) :735-740

[3] DETERMINATION OF TWIN FAULT PROBABILITIES FROM DIFFRACTION PATTERNS OF FCC METALS AND ALLOYS [J].

COHEN, JB ;

WAGNER, CNJ .

JOURNAL OF APPLIED PHYSICS, 1962, 33 (06) :2073-&

[4] USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING [J].

DEKEIJSER, TH ;

LANGFORD, JI ;

MITTEMEIJER, EJ ;

VOGELS, ABP .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) :308-314

[5] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J].

DELHEZ, R ;

DEKEIJSER, TH ;

MITTEMEIJER, EJ .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01) :1-16

[6]

DELHEZ R, 1980, NBS PUBLICATION

[7] THE DETERMINATION OF LATTICE-PARAMETERS AND STRAINS IN STRESSED THIN-FILMS USING X-RAY-DIFFRACTION WITH SEEMANN-BOHLIN FOCUSING [J].

HAASE, EL .

THIN SOLID FILMS, 1985, 124 (3-4) :283-291

[8]

HUANG TC, 1979, ADV XRAY ANAL, V22, P43

[9]

JAMES MR, 1980, TREATISE MATERIALS A, V19, P1

[10]

Klug H. P., 1970, XRAY DIFFRACTION PRO

← 1 2 →