INVESTIGATION OF NEUTRON-IRRADIATED SILICON BY DIFFUSE-X-RAY SCATTERING

被引：20

作者：

MAYER, W

PEISL, H

机构：

来源：

JOURNAL OF NUCLEAR MATERIALS | 1982年 / 108卷 / 1-2期

关键词：

D O I：

10.1016/0022-3115(82)90534-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：627 / 634

页数：8

共 17 条

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[8] HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING STUDY FROM NEARLY PERFECT SILICON SINGLE-CRYSTALS [J].

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[9] LATTICE DISTORTION NEAR VACANCIES IN DIAMOND AND SILICON .2. [J].

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