A PROFILE-FITTING PROCEDURE FOR ANALYSIS OF BROADENED X-RAY-DIFFRACTION PEAKS .2. APPLICATION AND DISCUSSION OF THE METHODOLOGY

被引：90

作者：

BENEDETTI, A

FAGHERAZZI, G

ENZO, S

BATTAGLIARIN, M

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷

关键词：

D O I：

10.1107/S0021889888006624

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：543 / 549

页数：7

共 17 条

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