共 57 条
[1]
THE SYNTHESIS OF X-RAY SPECTROMETER LINE PROFILES WITH APPLICATION TO CRYSTALLITE SIZE MEASUREMENTS
[J].
JOURNAL OF APPLIED PHYSICS,
1954, 25 (02)
:155-161
ALEXANDER, L
.
[2]
A PROFILE-FITTING PROCEDURE FOR ANALYSIS OF BROADENED X-RAY-DIFFRACTION PEAKS .2. APPLICATION AND DISCUSSION OF THE METHODOLOGY
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1988, 21
:543-549
BENEDETTI, A
;
FAGHERAZZI, G
;
ENZO, S
;
BATTAGLIARIN, M
.
[3]
X-RAY LINE BROADENING IN ISOTACTIC POLYSTYRENE
[J].
JOURNAL OF APPLIED PHYSICS,
1966, 37 (11)
:4003-&
BUCHANAN, DR
;
MILLER, RL
.
[4]
SOME PRACTICAL ASPECTS OF THE FOURIER DECONVOLUTION
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1983, 16 (FEB)
:103-112
CERNANSKY, M
.
[5]
TREATMENT OF ERRORS IN DECONVOLUTION OF LINE PROFILE MEASUREMENTS
[J].
PHILOSOPHICAL MAGAZINE,
1971, 23 (181)
:115-&
CHENG, R
;
WILLIAMS, B
;
COOPER, M
.
[6]
FOURIER-ANALYSIS OF POLYMER X-RAY-DIFFRACTION PATTERNS
[J].
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS,
1979, 17 (06)
:1001-1010
CRIST, B
;
COHEN, JB
.
[7]
CORRECTION OF INSTRUMENTAL ABERRATION - EXPERIMENTAL CRITERIA FOR UTILIZATION OF DECONVOLUTION METHODS
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1977, 10 (DEC)
:479-485
CROCHE, R
;
GATINEAU, L
.
[8]
de Bergevin F., 1972, Journal of Applied Crystallography, V5, P416, DOI 10.1107/S0021889872010052
[9]
THE DETERMINATION OF CRYSTALLITE-SIZE AND LATTICE-STRAIN PARAMETERS IN CONJUNCTION WITH THE PROFILE-REFINEMENT METHOD FOR THE DETERMINATION OF CRYSTAL-STRUCTURES
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1983, 16 (JUN)
:309-316
DEKEIJSER, TH
;
MITTEMEIJER, EJ
;
ROZENDAAL, HCF
.
[10]
USE OF THE VOIGT FUNCTION IN A SINGLE-LINE METHOD FOR THE ANALYSIS OF X-RAY-DIFFRACTION LINE BROADENING
[J].
JOURNAL OF APPLIED CRYSTALLOGRAPHY,
1982, 15 (JUN)
:308-314
DEKEIJSER, TH
;
LANGFORD, JI
;
MITTEMEIJER, EJ
;
VOGELS, ABP
.