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RAPID THERMAL-OXIDATION OF SILICON
被引:14
作者
:
ANG, ST
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,RALEIGH,NC 27695
N CAROLINA STATE UNIV,RALEIGH,NC 27695
ANG, ST
[
1
]
WORTMAN, JJ
论文数:
0
引用数:
0
h-index:
0
机构:
N CAROLINA STATE UNIV,RALEIGH,NC 27695
N CAROLINA STATE UNIV,RALEIGH,NC 27695
WORTMAN, JJ
[
1
]
机构
:
[1]
N CAROLINA STATE UNIV,RALEIGH,NC 27695
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1986年
/ 133卷
/ 11期
关键词
:
D O I
:
10.1149/1.2108408
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:2361 / 2362
页数:2
相关论文
共 6 条
[1]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[2]
DEAL BE, LECTURE NOTES CEI
[3]
IRENE EA, 1978, J ELCHEM SO, V125, P1149
[4]
NARAYAN J, 1983, 41ST DEV RES C BURL
[5]
RAPID THERMAL-PROCESSING OF THIN GATE DIELECTRICS - OXIDATION OF SILICON
NULMAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
NULMAN, J
KRUSIUS, JP
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
KRUSIUS, JP
GAT, A
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
GAT, A
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(05)
: 205
-
207
[6]
SHAFER SA, 1982, J VAC SCI TECHNOL, V21, P422
←
1
→
共 6 条
[1]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[2]
DEAL BE, LECTURE NOTES CEI
[3]
IRENE EA, 1978, J ELCHEM SO, V125, P1149
[4]
NARAYAN J, 1983, 41ST DEV RES C BURL
[5]
RAPID THERMAL-PROCESSING OF THIN GATE DIELECTRICS - OXIDATION OF SILICON
NULMAN, J
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
NULMAN, J
KRUSIUS, JP
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
KRUSIUS, JP
GAT, A
论文数:
0
引用数:
0
h-index:
0
机构:
CORNELL UNIV,NATL RES & RESOURCE FACIL SUBMICRON STRUCT,ITHACA,NY 14853
GAT, A
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(05)
: 205
-
207
[6]
SHAFER SA, 1982, J VAC SCI TECHNOL, V21, P422
←
1
→