USE OF RUTHERFORD SCATTERING ON A SECONDARY CARBON TARGET FOR CORRECTING INTERMEDIATE THICKNESS SAMPLE PIXE MEASUREMENTS

被引：23

作者：

ALOUPOGIANNIS, P ^{[1
]}

ROBAYE, G ^{[1
]}

ROELANDTS, I ^{[1
]}

WEBER, G ^{[1
]}

DELBROUCKHABARU, JM ^{[1
]}

QUISEFIT, JP ^{[1
]}

机构：

[1] UNIV PARIS 07,CHIM MILIEUX NAT LAB,CNRS,PHYSICOCHIM ATMOSPHERE LAB,F-75251 PARIS 05,FRANCE

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 14卷 / 03期

关键词：

D O I：

10.1016/0168-583X(86)90598-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：297 / 303

页数：7

共 9 条

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[6] PIXE CALIBRATION AND ABSORPTION CORRECTIONS WITH THE AID OF PROTON-SCATTERING [J].

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[7]

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