X-RAY AND FAR UV MULTILAYER MIRRORS - PRINCIPLES AND POSSIBILITIES

[1] ANTONOV AV, 1974, JETP LETT+, V20, P289

[2] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[3] Born M., 1959, PRINCIPLES OPTICS

[4] REFLECTANCE AND OPTICAL-CONSTANTS OF EVAPORATED RUTHENIUM IN VACUUM ULTRAVIOLET FROM 300 TO 2000 A [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (04) : 423 - 428

[5] OPTICAL THICKNESS MONITOR FOR THIN-FILM DEPOSITION [J]. APPLIED OPTICS, 1975, 14 (04): : 962 - 969

[6] EXTENSION OF 3P-]3S ION LASERS INTO VACUUM ULTRAVIOLET REGION [J]. APPLIED OPTICS, 1975, 14 (01) : 97 - 101

[7] ERSHOV OA, 1967, OPT SPECTROSC-USSR, V22, P66

[8] COUPLED WAVE THEORY FOR THICK HOLOGRAM GRATINGS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (09): : 2909 - +

[9] LUKIRSKII AP, 1964, OPT SPECTROSC, V16, P168

[10] SAMSON JAR, 1968, TECHNIQUES VACUUM UL

[1] ANTONOV AV, 1974, JETP LETT+, V20, P289

[2] DYNAMICAL DIFFRACTION OF X RAYS BY PERFECT CRYSTALS [J]. REVIEWS OF MODERN PHYSICS, 1964, 36 (03) : 681 - &

[3] Born M., 1959, PRINCIPLES OPTICS

[4] REFLECTANCE AND OPTICAL-CONSTANTS OF EVAPORATED RUTHENIUM IN VACUUM ULTRAVIOLET FROM 300 TO 2000 A [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (04) : 423 - 428

[5] OPTICAL THICKNESS MONITOR FOR THIN-FILM DEPOSITION [J]. APPLIED OPTICS, 1975, 14 (04): : 962 - 969

[6] EXTENSION OF 3P-]3S ION LASERS INTO VACUUM ULTRAVIOLET REGION [J]. APPLIED OPTICS, 1975, 14 (01) : 97 - 101

[7] ERSHOV OA, 1967, OPT SPECTROSC-USSR, V22, P66

[8] COUPLED WAVE THEORY FOR THICK HOLOGRAM GRATINGS [J]. BELL SYSTEM TECHNICAL JOURNAL, 1969, 48 (09): : 2909 - +

[9] LUKIRSKII AP, 1964, OPT SPECTROSC, V16, P168

[10] SAMSON JAR, 1968, TECHNIQUES VACUUM UL