MICROCHARACTERIZATION OF ELECTROLUMINESCENT DIODES WITH SCANNING ELECTRON-MICROSCOPE (SEM)

被引：15

作者：

BALK, LJ

KUBALEK, E

MENZEL, E

机构：

[1] SONDERFORSCHUNGSBEREICH FESTKORPERELEKTR,BASISLABOR,AACHEN,FED REP GER

[2] RHEIN WESTFAL TH AACHEN,INST WERKSTOFFE ELEKTROTECH,ABT FESTKORPERMESSTECH,AACHEN,FED REP GER

来源：

关键词：

D O I：

10.1109/T-ED.1975.18207

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：707 / 712

页数：6

共 15 条

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DEVINE, JZ
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (10) : 4136 - &
[2] BALK LJ, 1974, BEITR ELEKTRONENMIKR, V7, P249
[3] BALK LJ, 1973, BEDO, V6, P559
[4] BALK LJ, 1973, BEITR ELEKTRONENMIKR, V6, P551
[5] SCANNING ELECTRON-MICROSCOPE STUDIES OF ELECTROLUMINESCENT DIODES OF GAAS AND GAP .1. MICROGRAPHIC OBSERVATIONS
CHASE, BD
HOLT, DB
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1973, 19 (02): : 467 - 478
[6] CHASE BD, 1973, PHYS STATUS SOLIDI 3, V20, P459
[7] CHASE BD, 1973, PHYS STATUS SOLIDI 2, V20, P135
[8] GIMELFARB FA, 1973, SOV PHYS SEMICOND+, V7, P36
[9] ELECTRON-BEAM PENETRATION IN GAAS
MARTINELLI, RU
WANG, CC
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (07) : 3350 - 3351
[10] INVESTIGATION OF KILOVOLT ELECTRON-ENERGY DISSIPATION IN SOLIDS
MATSUKAWA, T
SHIMIZU, R
HARADA, K
KATO, T
[J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (02) : 733 - 740