DESCRIPTION OF LOW-ENERGY PEAK DISTORTION OBSERVED IN X-RAY SPECTROMETRY WITH SI(LI) DETECTORS

被引：13

作者：

HECKEL, J ^{[1
]}

SCHOLZ, W ^{[1
]}

机构：

[1] AKAD WISSENSCH DDR,ZENTRUM WISSENSCHAFTLICHEN GERATEBAU,DDR-1190 BERLIN,GER DEM REP

来源：

X-RAY SPECTROMETRY | 1987年 / 16卷 / 04期

关键词：

D O I：

10.1002/xrs.1300160409

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：181 / 185

页数：5

共 17 条

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[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 213 - 223
[7] ANALYTIC FITTING OF FULL ENERGY PEAKS FROM GE(LI) AND SI(LI) PHOTON DETECTORS
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[J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 143 (03): : 551 - 559
[8] THE ENERGY DISPERSIVE-X-RAY DETECTOR - A QUANTITATIVE MODEL
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[9] KEITH HD, 1975, XRAY SPECTROM, V5, P93
[10] ENTRANCE WINDOWS IN GERMANIUM LOW-ENERGY X-RAY DETECTORS
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[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (01) : 53 - 60

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