NANOLEX - A FORTRAN PROGRAM FOR ACCURATE ANALYSIS OF PARTICLE INDUCED X-RAY-SPECTRA

[1] ARTHUR RJ, 1983, THESIS B YOUNG U PRO

[2] X-RAY WAVELENGTHS [J]. REVIEWS OF MODERN PHYSICS, 1967, 39 (01) : 78 - &

[3] PROTON MICROPROBES AND PARTICLE-INDUCED X-RAY ANALYTICAL SYSTEMS [J]. ANNUAL REVIEW OF NUCLEAR AND PARTICLE SCIENCE, 1980, 30 : 211 - 252

[4] DANIELS RW, 1979, INTRO NUMERICAL METH, pCH8

[5] FOLKMANN F, 1975, J PHYS E SCI INSTRUM, V8, P429, DOI 10.1088/0022-3735/8/6/001

[6] SOME ASPECTS OF DETECTORS AND ELECTRONICS FOR X-RAY-FLUORESCENCE ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 213 - 223

[7] LEVEL STRUCTURE OF TM-171 [J]. CANADIAN JOURNAL OF PHYSICS, 1972, 50 (06) : 513 - &

[8] HAMMING RW, 1973, NUMERICAL METHODS SC, P278

[9] ANALYTICAL FUNCTIONS FOR FITTING PEAKS FROM GE SEMICONDUCTOR-DETECTORS [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 178 (2-3): : 499 - 512

[10] KAUFMANN HC, 1976, ADV XRAY ANAL, V19, P355

[1] ARTHUR RJ, 1983, THESIS B YOUNG U PRO

[2] X-RAY WAVELENGTHS [J]. REVIEWS OF MODERN PHYSICS, 1967, 39 (01) : 78 - &

[3] PROTON MICROPROBES AND PARTICLE-INDUCED X-RAY ANALYTICAL SYSTEMS [J]. ANNUAL REVIEW OF NUCLEAR AND PARTICLE SCIENCE, 1980, 30 : 211 - 252

[4] DANIELS RW, 1979, INTRO NUMERICAL METH, pCH8

[5] FOLKMANN F, 1975, J PHYS E SCI INSTRUM, V8, P429, DOI 10.1088/0022-3735/8/6/001

[6] SOME ASPECTS OF DETECTORS AND ELECTRONICS FOR X-RAY-FLUORESCENCE ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS, 1977, 142 (1-2): : 213 - 223

[7] LEVEL STRUCTURE OF TM-171 [J]. CANADIAN JOURNAL OF PHYSICS, 1972, 50 (06) : 513 - &

[8] HAMMING RW, 1973, NUMERICAL METHODS SC, P278

[9] ANALYTICAL FUNCTIONS FOR FITTING PEAKS FROM GE SEMICONDUCTOR-DETECTORS [J]. NUCLEAR INSTRUMENTS & METHODS, 1980, 178 (2-3): : 499 - 512

[10] KAUFMANN HC, 1976, ADV XRAY ANAL, V19, P355