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PROTON MICROPROBES AND PARTICLE-INDUCED X-RAY ANALYTICAL SYSTEMS

被引：115
作者：
CAHILL, TA
机构：
来源：
ANNUAL REVIEW OF NUCLEAR AND PARTICLE SCIENCE | 1980年 / 30卷
关键词：
D O I：
10.1146/annurev.ns.30.120180.001235
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
引用
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页码：211 / 252
页数：42
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