X-RAY SPECTROSCOPIC INVESTIGATION OF STRUCTURE OF SILICA, SILICATES AND OXIDES IN CRYSTALLINE AND VITREOUS STATE

被引:25
作者
WIECH, G
ZOPF, E
CHUN, HU
BRUCKNER, R
机构
[1] UNIV MUNCHEN,SEKT PHYS,MUNCHEN,FED REP GER
[2] TECH UNIV BERLIN,INST NICHT MET WERKSTOFFE,D-1000 BERLIN 12,FED REP GER
[3] UNIV FRANKFURT,INST PHYS CHEM,D-6000 FRANKFURT,FED REP GER
关键词
D O I
10.1016/0022-3093(76)90046-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:251 / 261
页数:11
相关论文
共 13 条
  • [1] Bruckner R., 1971, Journal of Non-Crystalline Solids, V5, P281, DOI 10.1016/0022-3093(71)90068-8
  • [2] Bruckner R., 1971, Journal of Non-Crystalline Solids, V5, P177, DOI 10.1016/0022-3093(71)90032-9
  • [3] Bruckner R., 1970, Journal of Non-Crystalline Solids, V5, P123, DOI 10.1016/0022-3093(70)90190-0
  • [4] BRUCKNER R, 1969, GLASTECH BER, V42, P322
  • [5] CHUN HU, 1967, Z NATURFORSCH PT A, VA 22, P1401
  • [6] PHOTOEMISSION MEASUREMENTS OF VALENCE LEVELS OF AMORPHOUS SIO2
    DISTEFANO, TH
    EASTMAN, DE
    [J]. PHYSICAL REVIEW LETTERS, 1971, 27 (23) : 1560 - +
  • [7] DUDEK HJ, 1972, GLASTECHN BER, V45, P10
  • [8] EITEL W, 1965, SILICATE SCI, V2
  • [9] HAMMEL JJ, 1965, 7TH P INT C GLASS BR
  • [10] LAUGER K, 1968, THESIS MUNCHEN