GRAZING BRAGG-LAUE DIFFRACTION FOR STUDYING THE CRYSTAL-STRUCTURE OF THIN-FILMS

被引：14

作者：

AFANASIEV, AM ^{[1
]}

AFANASIEV, SM ^{[1
]}

ALEKSANDROV, PA ^{[1
]}

IMAMOV, RM ^{[1
]}

PASHAEV, EM ^{[1
]}

机构：

[1] ACAD SCI USSR,INST CRYSTALLOG,MOSCOW V-71,USSR

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1984年 / 86卷 / 01期

关键词：

D O I：

10.1002/pssa.2210860153

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K1 / K5

页数：5

共 19 条

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[5]

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[6]

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[7]

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[8]

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[9] X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS ON CRYSTALS WITH AN AMORPHOUS SURFACE-FILM [J].

ALEKSANDROV, PA ;

AFANASIEV, AM ;

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STEPANOV, SA .

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[10] NEW APPLICATIONS OF X-RAY STANDING-WAVE FIELDS TO SOLID-STATE PHYSICS [J].

ANDERSEN, SK ;

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