THEORY OF ELASTIC TIP SURFACE INTERACTIONS IN ATOMIC FORCE MICROSCOPY

被引：44

作者：

OVERNEY, G

ZHONG, WQ

TOMANEK, D

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1991年 / 9卷 / 02期

关键词：

D O I：

10.1116/1.585550

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present a first-principles study of elastic surface deformations, limits of atomic resolution, and of atomic-scale friction in atomic force microscopy (AFM). In the case of a Pd AFM tip interacting with a graphite surface, we find that atomic resolution can be achieved in a narrow load range near almost-equal-to 10(-8) N (per Pd tip atom). For these loads, we determine the microscopic friction coefficient to be mu almost-equal-to 10(-2).

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页码：479 / 482

页数：4

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