LOW-ENERGY ELECTRON-LOSS SPECTROSCOPY AND AUGER-ELECTRON-SPECTROSCOPY STUDIES OF NOBLE-METAL SILICON INTERFACES - SI-AU SYSTEM

被引：56

作者：

PERFETTI, P

NANNARONE, S

PATELLA, F

QUARESIMA, C

CAPOZI, M

SAVOIA, A

OTTAVIANI, G

机构：

[1] UNIV MODENA,IST FIS,I-41100 MODENA,ITALY

[2] NAZL RICERCHE,NAZL STRUTT MAT CONSIGLIO GRP,I-41100 MODENA,ITALY

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.26.1125

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1125 / 1138

页数：14

共 42 条

[1] ULTRAVIOLET PHOTOELECTRON INVESTIGATION OF SI(111)-AU INTERFACE AT HIGH-TEMPERATURES [J].

ABBATI, I ;

BRAICOVICH, L ;

FRANCIOSI, A .

SOLID STATE COMMUNICATIONS, 1980, 33 (08) :881-884

[2] EVIDENCE OF INTERMIXING AT SI(III)-AU INTERFACE AT LIQUID-NITROGEN TEMPERATURE [J].

ABBATI, I ;

BRAICOVICH, L ;

FRANCIOSI, A .

PHYSICS LETTERS A, 1980, 80 (01) :69-71

[3] CHEMICAL BONDING AND STRUCTURE OF METAL-SEMICONDUCTOR INTERFACES [J].

ANDREWS, JM ;

PHILLIPS, JC .

PHYSICAL REVIEW LETTERS, 1975, 35 (01) :56-59

[4] DIELECTRIC-CONSTANT OF GOLD, COPPER, AND GOLD-COPPER ALLOYS BETWEEN 18 AND 35 EV [J].

BEAGLEHOLE, D ;

DECRESCENZI, M ;

THEYE, ML ;

VUYE, G .

PHYSICAL REVIEW B, 1979, 19 (12) :6303-6314

[5]

BISI O, UNPUB

[6] PHOTOEMISSION-STUDIES OF THE SILICON GOLD INTERFACE [J].

BRAICOVICH, L ;

GARNER, CM ;

SKEATH, PR ;

SU, CY ;

CHYE, PW ;

LINDAU, I ;

SPICER, WE .

PHYSICAL REVIEW B, 1979, 20 (12) :5131-5141

[7] COUPLED INTERFACE PLASMONS OF AL FILMS ON CDSE AND CDS [J].

BRILLSON, LJ .

PHYSICAL REVIEW LETTERS, 1977, 38 (05) :245-248

[8] ABRUPTNESS OF SEMICONDUCTOR-METAL INTERFACES [J].

BRILLSON, LJ ;

BRUCKER, CF ;

STOFFEL, NG ;

KATNANI, AD ;

MARGARITONDO, G .

PHYSICAL REVIEW LETTERS, 1981, 46 (13) :838-841

[9] TRANSITION IN SCHOTTKY-BARRIER FORMATION WITH CHEMICAL REACTIVITY [J].

BRILLSON, LJ .

PHYSICAL REVIEW LETTERS, 1978, 40 (04) :260-263

[10] MULTIPOLE AND SPIN-FLIP INTERBAND-TRANSITIONS IN THE ELECTRON-ENERGY LOSS OF FERROMAGNETIC FE [J].

CAPUTI, LS ;

COLAVITA, E ;

DECRESCENZI, M ;

MODESTI, S ;

PAPAGNO, L ;

SCARMOZZINO, R ;

ROSEI, R ;

TOSATTI, E .

SOLID STATE COMMUNICATIONS, 1981, 39 (01) :117-122

← 1 2 3 4 5 →