LOW-ENERGY ELECTRON-LOSS SPECTROSCOPY AND AUGER-ELECTRON-SPECTROSCOPY STUDIES OF NOBLE-METAL SILICON INTERFACES - SI-AU SYSTEM

被引：56

作者：

PERFETTI, P

NANNARONE, S

PATELLA, F

QUARESIMA, C

CAPOZI, M

SAVOIA, A

OTTAVIANI, G

机构：

[1] UNIV MODENA,IST FIS,I-41100 MODENA,ITALY

[2] NAZL RICERCHE,NAZL STRUTT MAT CONSIGLIO GRP,I-41100 MODENA,ITALY

来源：

PHYSICAL REVIEW B | 1982年 / 26卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.26.1125

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1125 / 1138

页数：14

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