STRUCTURAL STUDIES OF GLASSY SEMICONDUCTING SE-80-XTE20INX ALLOYS

被引：18

作者：

KUMAR, A ^{[1
]}

HUSAIN, M ^{[1
]}

SWARUP, S ^{[1
]}

NIGAM, AN ^{[1
]}

KUMAR, A ^{[1
]}

机构：

[1] HARCOURT BUTLER TECHNOL INST,DEPT PHYS,KANPUR 208002,UTTAR PRADESH,INDIA

来源：

X-RAY SPECTROMETRY | 1990年 / 19卷 / 05期

关键词：

D O I：

10.1002/xrs.1300190508

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The shift of the K‐absorption edge (ΔEK) was measured in Se80‐xTe20Inx, where 0 ≤ x ≤ 20. It is observed that the K‐edge of Se shifts progressively towards the lower energy side as the In concentration increases from 0 to 15 at.‐%. However, at higher concentrations, the relative shift starts to decrease. The results are in accordance with the Pauling concept of electronegativity and indicate that the nature of the bonds is iono‐covalent in these glasses, as found in many crystalline solids. The composition dependence of the edge shift is also discussed in terms of the structure of the Se‐Te system. Copyright © 1990 John Wiley & Sons, Ltd.

引用

页码：243 / 245

页数：3

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