A DIFFERENTIAL INTERFEROMETER FOR SCANNING FORCE MICROSCOPY

被引：19

作者：

CUNNINGHAM, MJ

CHENG, ST

CLEGG, WW

机构：

[1] Department of Electrical Engineering, Manchester University

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1994年 / 5卷 / 11期

关键词：

D O I：

10.1088/0957-0233/5/11/005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A magnetic force instrument is described which makes use of a differential interferometer which can be used with a very short length cantilever in the force detection assembly. Conventional methods work with cantilevers of a few millimetres in length, but are not suitable for the very much smaller commercial cantilevers which are now available. The instrument described contains novel features which enable it to be used with such cantilevers. Topographical images of calibration specimens and magnetic images of hard disk samples obtained using this instrument are presented.

引用

页码：1350 / 1354

页数：5

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