共 19 条
[1]
BORN M, 1991, PRINCIPLES OPTICS
[2]
BOUSQUET P, 1956, OPT ACTA, V3, P153
[3]
CELUSTKA B, 1970, J APPL PHYS, V41, P813, DOI 10.1063/1.1658758
[4]
WEAKLY ABSORBING LAYERS - INTERFEROMETRIC DETERMINATION OF THEIR OPTICAL PARAMETERS
[J].
APPLIED OPTICS,
1978, 17 (23)
:3738-3745
[5]
AUTOMATIC INTERFERENCE METHOD FOR MEASURING TRANSPARENT FILM THICKNESS
[J].
APPLIED OPTICS,
1993, 32 (13)
:2292-2294
[6]
OPTICAL INTERFERENCE METHOD FOR APPROXIMATE DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF A TRANSPARENT LAYER
[J].
APPLIED OPTICS,
1978, 17 (17)
:2779-2787
[7]
GRAVEY P, 1987, P SOC PHOTO-OPT INS, V862, P115
[8]
DETERMINATION OF REFRACTIVE INDED AND FILM THICKNESS FROM INTERFERENCE FRINGES
[J].
APPLIED OPTICS,
1971, 10 (10)
:2344-&
[9]
Heavens O. S., 1991, OPTICAL PROPERTIES T